Surface Analysis (SPM, EPMA)

Scanning Probe Microscope Shimadzu SPM-9700

Scanning Probe Microscope Shimadzu SPM-9700

Model: SPM-9700
Manufacturer: SHIMADZU
  • Higher performance, faster speeds, and easier operation
  • Images can be freely rotated, zoomed, and Z-axis magnification varied using the mouse
  • Up to 8 images can be displayed simultaneously and cross-section profiles can be analyzed in 3D images
  • With a generous selection of measurement modes, images can be obtained that show other information besides the sample shape
  • Controller is attached to an environment controlled chamber to control the temperature and humidity inside the chamber
  • The particle analysis software extracts multiple particles from SPM-9700 image data and calculates feature values for each particle, then analyzes and displays them
  • Resolution:  X, Y: 0.2 nm; Z: 0.01 nm
  • Light source: Laser diode (ON/OFF)
  • Detector: Photodetector
  • Max. sample size: 24 mm dia. x 8 mm
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High Resolution Scanning Probe Microscope Shimadzu SPM-8000FM

High Resolution Scanning Probe Microscope Shimadzu SPM-8000FM

Model: Shimadzu SPM-8000FM
Manufacturer: SHIMADZU
  • Achieves the performance level of a vacuum-type SPM, even in air and liquids
  • Noise in air and liquids is reduced to 1/20th that of existing methods
  • Uses the FM-AFM (Frequency Modulation - Atomic Force Microscope) method
  • Maximum 8 images can be displayed simultaneously, cross section shape can be displayed during scanning
  • Observation parameters can be specified
  • Resolution: X, Y: 0.2 nm, Z: 0.01 nm
  • Detector: Photodetector
  • Light source: Laser diode
  • Max. scanning size: 2.5 µm × 2.5 µm × 0.3 µm (X, Y, Z)
  • Max. sample size: 38 mm dia. x 8 mm

 

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Electron Probe Microanalyzer Shimadzu EPMA-1720

Electron Probe Microanalyzer Shimadzu EPMA-1720

Model: Shimadzu EPMA-1720
Manufacturer: SHIMADZU
  • High Sensitivity, High Accuracy, High Resolution, and Easy-to-Understand Operation
  • Both hardware and software incorporate the latest technologies to create the next generation of EPMA
  • Optimum X-Ray Spectrometer Design Offers Highly Sensitive and Accurate Analysis
  • Unprecedented Easy Operation Boosts Work Efficiency from SEM Observation to Analysis
  • Start SEM imaging with a single click
  • Simple, quick, and accurate adjustment of the beam current, while maintaining focus
  • Maintains the 52.5° X-ray take-off angle that is fundamental to analytical performance
  • Magnification: 40× to 400,000×
  • Electron Source: W (tungsten) filament
  • Resolution: 1 µm; Secondary-Electron Image Resolution: 6nm
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Electron Probe Microanalyzer Shimadzu EPMA-8050G

Electron Probe Microanalyzer Shimadzu EPMA-8050G

Model: EPMA-8050G
Manufacturer: SHIMADZU
  • This instrument is equipped with a cutting-edge FE electron optical system
  • Ultra High Resolution Mapping
  • Highest Secondary-Electron Image Resolution of 3 nm
  • Simple and Easy-to-Understand Operations for All Analyses
  • Ultra High Sensitivity Mapping
  • Advanced Technology Enabling Ultra High Sensitivity Analyses of Minute Areas
  • The system can be equipped with up to five 4-inch X-ray spectrometers which provide both high sensitivity and high resolution.
  • Electron Source: Schottky emitter
  • Magnification: 40× to 400,000×
  • Resolution: 1 µm; Secondary-Electron Image Resolution: 3 nm
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