X-ray Photoelectron Spectrometer

X-ray photoelectron spectrometer - Kratos AXIS Supra

X-ray photoelectron spectrometer - Kratos AXIS Supra

Model: AXIS Supra
Manufacturer: KRATOS - SHIMADZU
  • AXIS SupraTM combines state-of-the-art XPS performance with unrivalled automation and ease of use
  • Ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.
  • High sensitivity, excellent energy resolution and fast, high resolution imaging meet the analysis needs of the most demanding applications.
  • The sample analysis chamber (SAC) is manufactured from Mu-metal and has fifteen ports with line of sight to the sample analysis position
  • Flexible sample load lock, Sample magazine (up to 3 sample holders), Turbomolecular pump (240 l/sec) with oil-free scroll pump.
  • 180° hemispherical analyser (spectroscopy)
  • Combination sample holder with 15mm stub
  • Multitechnique Capability:

SAM: Scanning Auger Microscopy Schottky Field Emission Source
ISS: Ion Scattering Spectroscopy
SEM: Secondary electron microscopy
UPS: Ultraviolet Photoelectron Spectroscopy

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X-ray photoelectron spectrometer - Kratos AXIS Nova

X-ray photoelectron spectrometer - Kratos AXIS Nova

Model: AXIS Nova
Manufacturer: KRATOS - SHIMADZU
  • Highly automated X-ray photoelectron spectrometer with uncompromised spectroscopic performance required for demanding research applications.
  • In spectroscopy mode the large radius hemispherical sector analyser (HSA) ensures excellent photoelectron transmission guaranteeing high sensitivity and high energy resolution
  • The AXIS Nova provides unrivalled performance for fast elemental and chemical state imaging
  • Delay-line detector with 128 channels for photoelectron detection in spectroscopy mode
  • 180° hemispherical analyser
  • Ion source: Minibeam 4 : monatomic Ar+
  • Ion source: Minibeam 5 : Dual mode Ar+ & C24H12+
  • Ion source: Minibeam 6 : Arn+ GCIS
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X-ray photoelectron spectrometer  - Kratos AXIS Ultra DLD

X-ray photoelectron spectrometer - Kratos AXIS Ultra DLD

Model: AXIS Ultra DLD
Manufacturer: KRATOS - SHIMADZU
  • The first photoelectron spectrometer with a spherical mirror analyser (SMA) for fast, chemical state, parallel imaging
  • The hemispherical analyser provides both high energy resolution and high sensitivity spectroscopic performance
  • Delay-line detector  with over 100 detector channels
  • X-ray Sources: Dual anode (Mg and Al Kα source)
  • Electron energy analyser: 180° hemispherical analyser, 165mm mean radius, Spherical mirror analyser
  • Small spot selected area: 110um, 55um, 27um and 15um calibrated analysis areas
  • Multitechnique Capability:

SAM: Scanning Auger Microscopy Schottky Field Emission Source
ISS: Ion Scattering Spectroscopy
SIMS: Secondary Ion Mass Spectrometry (Quadrupole)
UPS: Ultraviolet Photoelectron Spectroscopy

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X-ray photoelectron spectrometer - Kratos AMICUS / ESCA 3400

X-ray photoelectron spectrometer - Kratos AMICUS / ESCA 3400

Model: AMICUS / ESCA 3400
Manufacturer: KRATOS - SHIMADZU
  • Developed from proven technology and incorporates the latest in digital control electronics producing an easy to use, flexible system suitable for all levels of expertise.
  • Used for a wide variety of applications ranging from routine laboratory use to quality control and assurance in production environments
  • Highly user friendly and data processing software enables both simple and complex studies to be carried out in a totally automated fashion
  • The ability to set up and store previously defined data acquisition and processing parameters ensures that reproducible procedures are maintained, an important criterion in quality control environments.
  • Sample introduction chamber: 10 sample introduction chamber (optional)
  • X-ray Source: Dual Mg/Al anodes
  • Electron energy analyser: Low pass/high pass filter, selectable pass energy, 25, 75, and 150eV, single channeltron detector
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Ar Gas Cluster Ion Source

Ar Gas Cluster Ion Source

Model: GCIS
Manufacturer: KRATOS - SHIMADZU
  • The Ar GCIS is designed to mount on a DN64 (4.5" OD) flange with a working distance appropriate for both the AXIS Ultra DLD and AXIS Nova photoelectron spectrometers
  • The GCIS is also designed to operate with monomer He+ for ion scattering spectroscopy (ISS) experiments
  • Optimised for depth profiling organic materials in Arn+ cluster mode and inorganic materials in Ar+ monomer mode
  • Ions can be accelerated up to a maximum of 20 keV
  • Complete automation of the gas handling system means that the GCIS can be run unattended or remotely
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