X-ray Fluorescence Spectroscopy

X-ray fluorescence spectrometry EDX-7000/8000

X-ray fluorescence spectrometry EDX-7000/8000

Model: EDX-7000/8000
Manufacturer: SHIMADZU
  • Using for RoHS/ELV standards
  • Quantitative - Qualitative analysis for elements from Al (Aluminium) to U (Urani)
  • Automatic selecting material with Screening software before analysis
  • Using the machine easy and fast
  • Automatic aging X-ray tube if long time no used the machine 
  • X - ray tube from 5kV to 50kV
  • Using high-performance SDD detector, no need liquid nitrogen
  • Using CCD camera, easy to observe the analysis-sample position in chamber
  • Equipping door interlock mechanism against X-ray exposure
  • Power supply 220VAC to 240VAC
  • Dimension and weight: W 460 × D 590 × H 360 mm, 45 kg
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Wavelength Dispersive X-Ray Fluorescence Spectrometer MXF-2400

Wavelength Dispersive X-Ray Fluorescence Spectrometer MXF-2400

Model: MXF-2400
Manufacturer: SHIMADZU
  • Foctoty Lab
  • R&D and production control
  • Other industries
  • High level of automation and labor saving
  • About 36 elements in a sample can be determined in a minute
  • The result is stable and high quality
  • High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
  • Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer
  • Impurity elements as well as major elements in various types of samples can be readily determined
  • The operation is stable enough to permit unattended operation to save labor and running cost
  • The optional scanning monochrometer is convenient for automated qualitative analyses in R&D
  • Excellent stability in quality control
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Wavelength Dispersive X-Ray Fluorescence Spectrometer

Wavelength Dispersive X-Ray Fluorescence Spectrometer

Model: XRF-1800
Manufacturer: SHIMADZU
  • Lab Center and R&D
  • Other industries
  • World first 250µm Mapping for wavelength dispersive analysis 
  • Qualitative/quantitative analysis using higher-order X-rays
  • Film thickness measurement and inorganic component analysis for high-polymer thin films with background FP method.
  • It enables to analyze content distribution and intensity distribution of non uniform sample
  • More accurate evaluation of higher-order X-rays makes higher
  • Local analysis
  • Ease of use
  • Optimal conditions can be created based on prepared conditions for sample forms like liquid, powder, solid, metal and oxides
  •  High reliability.
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