News/Events

News

SPM-9700 – Nano scanning probe Microscope

This best-selling model features a contact mode and dynamic mode (by frequency modulation). With extensive functionality and expandability, it is capable of meeting a diverse range of requirements. The revolutionary software interface ensures that the operations for everything from observation to data analysis can be performed with confidence.

Nano 3D Mapping

Visualizing the Physical Properties of Nano-Regions on Surface or Interface

The physical properties of external or boundary surfaces can be evaluated by measuring the force acting on a scanning probe microscope cantilever probe as its distance from the sample is varied (force curve measurement).

Key Features

  1. The adhesive force and Young's modulus can be evaluated at a specifi­c target location by measuring the force curve at that point (point analysis).
  2. By acquiring force curves at multiple points, a two-dimension map of the physical properties can be created (mapping analysis).
  3. Acquired data can be displayed three-dimensionally, or specifi­c data can be extracted for data analysis (3D analysis).
  4. Quantitative Young's modulus values can be calculated from a theoretical model.

Evaluating Physical Properties at Any Point on a Film

Force curves were measured at arbitrary points on a ­film surface. The results show that the adhesive force is different at the respective points.

Similarly, physical properties can also be evaluated on small soft samples, such as biopolymers.

3D Analysis

All force curves acquired for mapping are saved. Therefore, the data can be displayed three-dimensionally, or specifi­c cross sections can be extracted for data analysis.

Mapping the Physical Properties of Plastic Films

Mapping analysis can be used to measure adhesive force and Young's modulus as well as surface topography. The figure shows a quantitative visualization of the Young's modulus within a localized area only 300 nm wide on a plastic film surface. (Sample source: MORESCO).

Application example: Evaluating the uniformity of a polymer material surface

Adhesive Part of an Adhesive Tape

These images are from an evaluation of the adhesive part of an adhesive tape. They show that the adhesive force is distributed non-uniformly. This demonstrates how the system can be used to evaluate adhesive properties, which were difficult to evaluate using conventional methods.

Application example: Evaluating the localized adhesive properties of thin films.

Main Speci­cations

Force Cure

Measurement

Scan (Z) range

Settings method

Specify end point and width, and automatically track end point

Range

Depends on scanner

Scanning speed

Frequency setting

0.1 to 100Hz

Frequency setting step size

0.1Hz

XY movement

Settings method

Numerical entry, or speciƒed with mouse on SPM image

Range

Depends on scanner

Display

SPM image data, force curve waveform, measurement parameters, and data analysis results

Mapping

Measurement

Physical quantities measured

Adsorption force, slope of force curve, Z-position, or elastic modulus

Range

Depends on scanner

Resolution

512×512, 256×256, 128×128, 64×64, 32×32, 16×16, 8×8, 4×4, 2×2

Display

SPM image data, force curve waveform, and measurement parameters

 

Source: ETA

Others

@ 2015 Tecotec Group