Surface Analysis (SPM, EPMA)

Scanning Probe Microscope Shimadzu SPM-9700

Model: SPM-9700

Manufacturer: SHIMADZU

Higher performance, faster speeds, and easier operation
Images can be freely rotated, zoomed, and Z-axis magnification varied using the mouse
Up to 8 images can be displayed simultaneously and cross-section profiles can be analyzed in 3D images
With a generous selection of measurement modes, images can be obtained that show other information besides the sample shape
Controller is attached to an environment controlled chamber to control the temperature and humidity inside the chamber
The particle analysis software extracts multiple particles from SPM-9700 image data and calculates feature values for each particle, then analyzes and displays them
Resolution: X, Y: 0.2 nm; Z: 0.01 nm
Light source: Laser diode (ON/OFF)
Detector: Photodetector
Max. sample size: 24 mm dia. x 8 mm

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