X-ray Photoelectron Spectrometer

• AXIS Supra^TM combines state-of-the-art XPS performance with unrivalled automation and ease of use
• Ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.
• High sensitivity, excellent energy resolution and fast, high resolution imaging meet the analysis needs of the most demanding applications.
• The sample analysis chamber (SAC) is manufactured from Mu-metal and has fifteen ports with line of sight to the sample analysis position
• Flexible sample load lock, Sample magazine (up to 3 sample holders), Turbomolecular pump (240 l/sec) with oil-free scroll pump.
• 180° hemispherical analyser (spectroscopy)
• Combination sample holder with 15mm stub
• Multitechnique Capability:

SAM: Scanning Auger Microscopy Schottky Field Emission Source
ISS: Ion Scattering Spectroscopy
SEM: Secondary electron microscopy
UPS: Ultraviolet Photoelectron Spectroscopy

• Highly automated X-ray photoelectron spectrometer with uncompromised spectroscopic performance required for demanding research applications.
• In spectroscopy mode the large radius hemispherical sector analyser (HSA) ensures excellent photoelectron transmission guaranteeing high sensitivity and high energy resolution
• The AXIS Nova provides unrivalled performance for fast elemental and chemical state imaging
• Delay-line detector with 128 channels for photoelectron detection in spectroscopy mode
• 180° hemispherical analyser
• Ion source: Minibeam 4 : monatomic Ar⁺
• Ion source: Minibeam 5 : Dual mode Ar⁺ & C₂₄H₁₂⁺
• Ion source: Minibeam 6 : Arn⁺ GCIS

• The first photoelectron spectrometer with a spherical mirror analyser (SMA) for fast, chemical state, parallel imaging
• The hemispherical analyser provides both high energy resolution and high sensitivity spectroscopic performance
• Delay-line detector  with over 100 detector channels
• X-ray Sources: Dual anode (Mg and Al Kα source)
• Electron energy analyser: 180° hemispherical analyser, 165mm mean radius, Spherical mirror analyser
• Small spot selected area: 110um, 55um, 27um and 15um calibrated analysis areas
• Multitechnique Capability:

SAM: Scanning Auger Microscopy Schottky Field Emission Source
ISS: Ion Scattering Spectroscopy
SIMS: Secondary Ion Mass Spectrometry (Quadrupole)
UPS: Ultraviolet Photoelectron Spectroscopy

• Developed from proven technology and incorporates the latest in digital control electronics producing an easy to use, flexible system suitable for all levels of expertise.
• Used for a wide variety of applications ranging from routine laboratory use to quality control and assurance in production environments
• Highly user friendly and data processing software enables both simple and complex studies to be carried out in a totally automated fashion
• The ability to set up and store previously defined data acquisition and processing parameters ensures that reproducible procedures are maintained, an important criterion in quality control environments.
• Sample introduction chamber: 10 sample introduction chamber (optional)
• X-ray Source: Dual Mg/Al anodes
• Electron energy analyser: Low pass/high pass filter, selectable pass energy, 25, 75, and 150eV, single channeltron detector

• The Ar GCIS is designed to mount on a DN64 (4.5" OD) flange with a working distance appropriate for both the AXIS Ultra DLD and AXIS Nova photoelectron spectrometers
• The GCIS is also designed to operate with monomer He⁺ for ion scattering spectroscopy (ISS) experiments
• Optimised for depth profiling organic materials in Ar_n⁺ cluster mode and inorganic materials in Ar⁺ monomer mode
• Ions can be accelerated up to a maximum of 20 keV
• Complete automation of the gas handling system means that the GCIS can be run unattended or remotely